|
Scanning Transmission Electron Microscope CM12
Images
The STEM combines the features of both TEM and SEM. It can be used
in standard TEM mode for thin samples or in scanning mode for thin or bulk
samples. In scanning mode, a high brightness source (LaB6) produces a focused
beam with high current density and small diameter for EDS microanalysis.
Spatial resolution for microanalysis (about 2 nm for thin specimens) is
much better than it is for microanalysis in SEM for bulk samples (about
0.5-3 microns).
STEM CM12 is a high quality computerized microscope with a wide range
of imaging and analytical capabilities, including a state-of-the-art EDS
system. |
|
STEM CM12 specifications
High voltage range
Electron gun
Eucentric goniometer stage
Camera length
STEM magnifications
Minimum focussed probe
Image media |
20 to 120 kV
LaB6
±60°
25 to 6500 mm
70 to 510,000
2 nm
Scanning mode - digital storage and/or Polaroid film.
TEM mode - photo plates. |
Standard, Be (for EDS) and Bulk side-entry specimen holders
Digital EDS Prism detector with IMIX-PC system. |
|
|
|
