UMKC Center for Research on Interfacial Structure and Properties (UMKC-CRISP)

Scanning Probe Microscopy (SPM) and Nanoindentation Laboratory

 

 


 

 

 

 

 

 

 

 

 

 

 

 

 

 

Scanning Probe Microscopy (SPM) and Nanoindentation Laboratory is focused on nanoscale characterization of materials and structures. It features high resolution scanning probe techniques for atomic- and nano-scale characterization to image the topography of surfaces at the sub-100 micron scale. Nanoindenting is performed in conjunction with SPM. The area for testing is located by SPM imaging, and indentations imaged by SPM after testing. The depth of the indentation is measured from the SPM image to evaluate hardness. A force-displacement curve obtained during indentation also provides indications of the sample material's mechanical and physical properties.

Scanning Probe Microscopy and Nanoindentation Laboratory features:

Molecular Imaging Pico Scan 5 Atomic Force Microscopy (AFM)

  • Environmental chamber
  • Ambient or fluid imaging
  • Temperature control Ambient to 250 ºC, -5 ºC to 40 ºC, or ambient to -30 ºC. ±0.1 ºC
  • Image pixel resolution Up to 1024 × 1024
  • Three stepper motor controlled automatic vertical tip approach
  • Scan range 100 µm with large scanner
  • Atomic resolution with small scanner
  • Maximum sample size 2 cm × 2 cm approximately 5 mm thick

Veeco Metrology MultiMode Scanning Probe Microscope

  • AS-130 ('J") scanner with scan size 125 µm x 125 µm, vertical range is 5.0 µm
  • Images consist of raster-scanned, electronic renderings of sample surface for small samples (1.5cm dia.)
  • Designed around a stationary probe
  • 16-bit resolution on all three axes
  • Contact and tapping mode operation

Hysitron TS 70 TriboScope

  • An AFM attachment for precise test placement and microstructure identification combined with SPM imaging
  • The in-situ images are obtained over the sample surface and can be used to reliably place a test within 10 nm of the desired testing location
  • Hardness measurements for submicron-size features
  • AFM cannot be used for samples with a roughness > 5 µm, structure sizes > 100 µm, loose particles
  • Elastic modulus
  • Load
    • Resolution: <1 nN
    • Noise Floor: 100 nN
  • Displacement
    • Resolution: 0.0004 nm
    • Noise Floor: 0.2 nm
    • Drift: < 0.05 nm/sec